Title :
29.3 A 14b 1GS/s RF sampling pipelined ADC with background calibration
Author :
Ali, Ahmed M. A. ; Dinc, Huseyin ; Bhoraskar, Paritosh ; Dillon, Chris ; Puckett, Scott ; Gray, Bryce ; Speir, Carroll ; Lanford, Jonathan ; Jarman, David ; Brunsilius, Janet ; Derounian, Peter ; Jeffries, Brad ; Mehta, Ushma ; McShea, Matthew ; Ho-Young
Author_Institution :
Analog Devices, Greensboro, NC, USA
Abstract :
We describe a 14-bit 1GS/s pipelined ADC that relies on correlation-based background calibration to correct the inter-stage gain, settling (dynamic) and memory errors. An effective dithering technique is embedded in the calibration signal to break the dependence of the calibration on the input signal amplitude. In addition, to improve the sampling linearity, the ADC employs input distortion cancellation and another digital calibration to compensate for the non-linear charge injection (kickback) from the sampling capacitors on the input driver. The ADC is fabricated in a 65nm CMOS process and has an integrated input buffer. With a 140MHz and 2Vpp input signal, the SNR is 69dB, the SFDR is 86dB, and the power is 1.2W.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; error correction; pipeline processing; signal sampling; CMOS process; RF sampling pipelined ADC; analog-digital converter; correlation based background calibration; digital calibration; dithering technique; dynamic error; input distortion cancellation; interstage gain correction; memory error; nonlinear charge injection; power 1.2 W; sampling capacitors; settling error; wavelength 65 nm; Bandwidth; Calibration; Capacitors; Latches; MOS devices; Pipelines; Solid state circuits;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-0918-6
DOI :
10.1109/ISSCC.2014.6757522