DocumentCode :
2625703
Title :
Statistical testing of random number sequences using CUDA
Author :
Suciu, Alin ; Zegreanu, Lidia ; Zima, Catalin Tudor
Author_Institution :
Comput. Sci. Dept., Tech. Univ. of Cluj-Napoca, Cluj-Napoca, Romania
fYear :
2010
fDate :
26-28 Aug. 2010
Firstpage :
369
Lastpage :
374
Abstract :
Previous research in the field of statistical testing of random number sequences using Graphics Processing Units (GPU) has shown that this approach yields a significant increase in performance for a subset of the statistical tests proposed by National Institute of Standards and Technology (NIST). The present paper aims at further improvements in the performance of statistical testing of random number sequences, by focusing on another technology dedicated to GPU computing, the Compute Unified Device Architecture (CUDA). CUDA extends the C programming language with functionality for massively parallel programming on GPUs. Due to the flexibility given by the CUDA memory and thread model plus the optimizations that take advantage of the Parallel Data Cache, we were able to further improve the performance of the statistical testing algorithms proposed by NIST. Experimental results show speedups of up to 219, depending on the test and the size of the input data, with an overall average speedup of 51.
Keywords :
C++ language; computer graphic equipment; coprocessors; parallel architectures; parallel programming; random number generation; random sequences; statistical testing; C programming language; CUDA memory; GPU computing; compute unified device architecture; graphics processing units; parallel data cache; parallel programming; random number sequences; statistical testing algorithm; thread model; Computational modeling; Graphics; Graphics processing unit; Instruction sets; NIST; Programming; Statistical analysis; CUDA; GPGPU; GPU; parallel implementation; random numbers; statistical testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Computer Communication and Processing (ICCP), 2010 IEEE International Conference on
Conference_Location :
Cluj-Napoca
Print_ISBN :
978-1-4244-8228-3
Electronic_ISBN :
978-1-4244-8230-6
Type :
conf
DOI :
10.1109/ICCP.2010.5606413
Filename :
5606413
Link To Document :
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