Title :
Design and test-the two sides of a coin
Author :
Agrawal, Vishwani D.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
Abstract :
Summary form only given. The automation of the design and test of VLSI circuits is discussed. Principles that the author believes will guide the design and test methodology of the future are stated. They are: the principle of hierarchy, the principle of orthogonality, the principle of standardization, and computing resource sharing. The principles apply equally to design and test, strengthening the view that design and test are two sides of the same coin
Keywords :
VLSI; circuit CAD; integrated circuit testing; logic testing; standardisation; VLSI circuits; hierarchy; orthogonality; resource sharing; standardization; Automatic testing; Built-in self-test; Computational modeling; Computer networks; Design automation; Design methodology; Logic testing; Standardization; Timing; Very large scale integration;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1991. ICCD '91. Proceedings, 1991 IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-2270-9
DOI :
10.1109/ICCD.1991.139831
