Title :
CAD tools for analysis of process variability effects in deep submicron CMOS circuits
Author :
Kuzmicz, W. ; Piwowarska, E. ; Pfitzner, A. ; Kasprowicz, D.
Author_Institution :
Warsaw Univ. of Technol., Warsaw
Abstract :
A special CAD toolset for process, device and circuit statistical simulation is described. Variability is introduced in the process parameter space, not in the space of parameters of the circuit components. As a result, complex dependencies and correlations between process parameters and circuit performance are taken into account in a realistic way. Application to analysis of static current consumption in deep submicron CMOS digital circuits is demonstrated.
Keywords :
CMOS digital integrated circuits; circuit CAD; circuit simulation; CAD toolset; circuit components; circuit statistical simulation; deep submicron CMOS digital circuits; process variability; static current consumption; CMOS digital integrated circuits; CMOS process; CMOS technology; Circuit optimization; Circuit simulation; Circuit testing; Digital circuits; MOSFETs; Manufacturing processes; Space technology;
Conference_Titel :
Computational Technologies in Electrical and Electronics Engineering, 2008. SIBIRCON 2008. IEEE Region 8 International Conference on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4244-2133-6
Electronic_ISBN :
978-1-4244-2134-3
DOI :
10.1109/SIBIRCON.2008.4602572
