Title :
Vista rail network simulation
Author :
Lee-Gunther, Jane ; Bolduc, Mickie ; Butler, Scott
Author_Institution :
Booz Allen & Hamilton Inc., Arlington, VA, USA
Abstract :
Vista is a quick-running rail network simulation software package. It allows rail analysts to assess, predict and identify improvements to rail operations as well as design new rail and signalling systems. Vista calculates train performance based on: (1) specified physical characteristics of the trains and the track; (2) train routing; and (3) train control system and junction management algorithms. It can also evaluate the effect of random and fixed failures on rail operations. It produces tabular and graphical output reports that compile rail system and train statistics. Vista is user-friendly. It has a menu-driven interface for specifying inputs and viewing outputs as well as run-time animated graphics that permit the user to instantly see simulated train operations. Vista runs on a 486 or Pentium-based PC in Microsoft Windows 3.1. It is written in C++ using state-of the-art object-oriented design. Vista simulation runs take seconds to minutes depending on the complexity of the network, signalling system, and the number of trains
Keywords :
computer animation; control system analysis computing; digital simulation; microcomputer applications; rail traffic; railways; signalling; software packages; traffic control; user interfaces; 486; C++; Microsoft Windows 3.1; PC; Pentium; Vista; algorithms; control system; failures; graphical output reports; junction management; menu-driven interface; object-oriented design; physical characteristics; rail network simulation; rail operations; run time; run-time animated graphics; signalling systems; software package; tabular output reports; track; train performance; train routing; user-friendly; Control systems; Object oriented modeling; Rails; Routing; Runtime; Signal analysis; Signal design; Signal processing; Software packages; Statistics;
Conference_Titel :
Railroad Conference, 1995., Proceedings of the 1995 IEEE/ASME Joint
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-2556-7
DOI :
10.1109/RRCON.1995.395164