DocumentCode :
2626421
Title :
Introducing the emitter turn-off thyristor (ETO). Numerical and experimental demonstration of unity turn-off gain capability
Author :
Li, Yuxin ; Huang, Alex Q. ; Motto, Kevin ; Xu, Aaron Z.
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
fYear :
1998
fDate :
12-15 Oct 1998
Firstpage :
2
Lastpage :
9
Abstract :
The emitter turn-off thyristor (ETO) is a novel hybrid MOS-bipolar high power semiconductor device with the advantages of gate turn-off thyristor´s (GTO) high voltage and high current capabilities, and the ease of control of a MOS gate. The introduction of the emitter turn-off technology in the ETO also results in a significantly improved speed and reverse biased safe operating area (RBSOA). Other promising features of the ETO include the high-voltage current saturation capability and on-device current sensing capability. These technological advancements are achieved through the change of fundamental device physics that govern the operation of high power GTO devices through a low cost and efficient packaging technology. Numerical analysis and experimental demonstration of the ETO´s unity turn-off gain capability are presented in this paper
Keywords :
semiconductor device measurement; semiconductor device models; semiconductor device testing; thyristors; emitter turn-off thyristor; experimental demonstration; high-voltage current saturation capability; hybrid MOS-bipolar high power semiconductor device; numerical analysis; on-device current sensing capability; packaging technology; reverse biased safe operating area; technological advancements; unity turn-off gain capability; Cathodes; Inductance; MOSFET circuits; Power MOSFET; Power semiconductor devices; Snubbers; Switches; Technological innovation; Thyristors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Congress, 1998. CIEP 98. VI IEEE International
Conference_Location :
Morelia
Print_ISBN :
0-7803-5006-5
Type :
conf
DOI :
10.1109/CIEP.1998.750653
Filename :
750653
Link To Document :
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