• DocumentCode
    2626457
  • Title

    An approach to modify and test expired window logic

  • Author

    Tsai, W.T. ; Bai, Xiaoying ; Paul, Raymond ; Devaraj, George ; Agarwal, Vivek

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Arizona State Univ., Phoenix, AZ, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    99
  • Lastpage
    108
  • Abstract
    The windowing technique has been a popular method to address the Y2K problem. In fact, about 80% of the systems used this technique. Unfortunately, the windowing technique is a temporary solution and windows will expire some time later. This paper proposes several approaches to address the expired window problem including modification and testing techniques. In software modification, ripple effect technique is used to locate all the necessary software elements need to be changed. In testing, both regression techniques and new test case generation techniques are proposed
  • Keywords
    integrated software; multiprogramming; program testing; software quality; user interfaces; Y2K problem; regression techniques; ripple effect technique; software elements; software modification; test case generation techniques; test expired window logic; windowing technique; Computer science; Logic testing; Software systems; Software testing; System testing; USA Councils; User interfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Software, 2000. Proceedings. First Asia-Pacific Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    0-7695-0825-1
  • Type

    conf

  • DOI
    10.1109/APAQ.2000.883783
  • Filename
    883783