Title :
An approach to modify and test expired window logic
Author :
Tsai, W.T. ; Bai, Xiaoying ; Paul, Raymond ; Devaraj, George ; Agarwal, Vivek
Author_Institution :
Dept. of Comput. Sci. & Eng., Arizona State Univ., Phoenix, AZ, USA
Abstract :
The windowing technique has been a popular method to address the Y2K problem. In fact, about 80% of the systems used this technique. Unfortunately, the windowing technique is a temporary solution and windows will expire some time later. This paper proposes several approaches to address the expired window problem including modification and testing techniques. In software modification, ripple effect technique is used to locate all the necessary software elements need to be changed. In testing, both regression techniques and new test case generation techniques are proposed
Keywords :
integrated software; multiprogramming; program testing; software quality; user interfaces; Y2K problem; regression techniques; ripple effect technique; software elements; software modification; test case generation techniques; test expired window logic; windowing technique; Computer science; Logic testing; Software systems; Software testing; System testing; USA Councils; User interfaces;
Conference_Titel :
Quality Software, 2000. Proceedings. First Asia-Pacific Conference on
Conference_Location :
Hong Kong
Print_ISBN :
0-7695-0825-1
DOI :
10.1109/APAQ.2000.883783