DocumentCode
2626734
Title
Statistical feature based target recognition
Author
Mitchell, Richard A. ; Westerkamp, John J.
Author_Institution
AFRL-SNAT, Wright Patterson AFB, OH, USA
fYear
1998
fDate
13-17 Jul 1998
Firstpage
111
Lastpage
118
Abstract
The statistical feature-based (StaF) classifier is presented for robust high range resolution (HRR) radar moving ground target identification. The target features used for classification are the amplitude and location of HRR signature peaks. The StaF classifier was initially developed for air target identification with the primary goal of increasing classifier robustness by maintaining high performance known target identification while minimizing errors from unknown targets. Meeting this requirement is significantly more challenging than forced decision classification. Results are presented showing the performance variability of the StaF classifier with respect to feature extraction variations. More importantly, the StaF classifier performance is compared to that of the quadratic classifier. It is found that the StaF classifier performs significantly better than the quadratic at high declaration rates demonstrating that the StaF classifier can significantly reduce errors associated with unknown targets while maintaining a high probability of correct classification
Keywords
estimation theory; feature extraction; image classification; military computing; probability; radar detection; radar target recognition; statistical analysis; StaF classifier; air target identification; errors; forced decision classification; high declaration rates; high range resolution radar; moving ground target identification; multihypothesis; peak amplitude probability density function; signature peaks; statistical feature-based classifier; target features; target recognition; Clutter; Data mining; Error correction; Feature extraction; Meteorological radar; Probability; Radar imaging; Robustness; Sensor systems; Target recognition;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace and Electronics Conference, 1998. NAECON 1998. Proceedings of the IEEE 1998 National
Conference_Location
Dayton, OH
ISSN
0547-3578
Print_ISBN
0-7803-4449-9
Type
conf
DOI
10.1109/NAECON.1998.710105
Filename
710105
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