DocumentCode
2626851
Title
Polarization phase-based method for material classification and object recognition in computer vision
Author
Chen, Hua ; Wolff, Lawrence B.
Author_Institution
Dept. of Comput. Sci., Johns Hopkins Univ., Baltimore, MD, USA
fYear
1996
fDate
18-20 Jun 1996
Firstpage
128
Lastpage
135
Abstract
A robust and accurate polarization phase-based technique for material classification is presented. The novelty of this technique is three-fold In (i) its theoretical development, (ii) its application, and, (iii) its experimental implementation. The concept of phase of polarization of a light wave is introduced to computer vision for discrimination between materials according to their intrinsic electrical conductivity, such as distinguishing conducting metals, and poorly-conducting dielectrics. Previous work has used intensity, color and polarization component ratios. This new method is based on the physical principle that metals retard orthogonal components of light upon reflection while dielectrics do not. This method has significant complementary advantages with respect to existing techniques, is computationally efficient, and can be easily implemented with existing imaging technology. Experiments for real circuit board inspection, non-conductive and conductive glass, and, outdoor object recognition have been performed to demonstrate its accuracy and potential capabilities
Keywords
automatic optical inspection; computer vision; image classification; object recognition; polarimetry; printed circuit testing; reflectometry; circuit board inspection; computer vision; intrinsic electrical conductivity; material classification; object recognition; outdoor object recognition; polarization phase-based technique; Application software; Computer vision; Conducting materials; Conductivity; Dielectric materials; Inorganic materials; Optical polarization; Optical reflection; Printed circuits; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 1996. Proceedings CVPR '96, 1996 IEEE Computer Society Conference on
Conference_Location
San Francisco, CA
ISSN
1063-6919
Print_ISBN
0-8186-7259-5
Type
conf
DOI
10.1109/CVPR.1996.517064
Filename
517064
Link To Document