Title :
Power measurement techniques on standard compute nodes: A quantitative comparison
Author :
Hackenberg, Daniel ; Ilsche, Thomas ; Schone, Robert ; Molka, Daniel ; Schmidt, Martin ; Nagel, Wolfgang E.
Author_Institution :
Center for Inf. Services & High Performance Comput. (ZIH), Tech. Univ. Dresden, Dresden, Germany
Abstract :
Energy efficiency is of steadily growing importance in virtually all areas from mobile to high performance computing. Therefore, lots of research projects focus on this topic and strongly rely on power measurements from their test platforms. The need for finer grained measurement data-both in terms of temporal and spatial resolution (component breakdown)-often collides with very rudimentary measurement setups that rely e.g., on non-professional power meters, IMPI based platform data or model-based interfaces such as RAPL or APM. This paper presents an in-depth study of several different AC and DC measurement methodologies as well as model approaches on test systems with the latest processor generations from both Intel and AMD. We analyze most important aspects such as signal quality, time resolution, accuracy, and measurement overhead and use a calibrated, professional power analyzer as our reference.
Keywords :
energy conservation; microprocessor chips; power aware computing; power consumption; power measurement; power meters; AC measurement methodology; AMD; APM; DC measurement methodology; IMPI based platform data; Intel; RAPL; component breakdown; energy efficiency; measurement overhead; model-based interface; nonprofessional power meter; power analyzer; power measurement; processor generation; signal quality; spatial resolution; standard compute node; temporal resolution; test system; time resolution; Accuracy; Energy measurement; Instruments; Power demand; Power measurement; Sockets; Temperature measurement;
Conference_Titel :
Performance Analysis of Systems and Software (ISPASS), 2013 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-5776-0
Electronic_ISBN :
978-1-4673-5778-4
DOI :
10.1109/ISPASS.2013.6557170