• DocumentCode
    2627286
  • Title

    A 1-ps Resolution On-Chip Sampling Oscilloscope with 64:1 Tunable Sampling Range Based on Ramp Waveform Division Scheme

  • Author

    Inagaki, Kenichi ; Antono, Danardono Dwi ; Takamiya, Makoto ; Kumashiro, Shigetaka ; Sakurai, Takayasu

  • Author_Institution
    Tokyo Univ.
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    61
  • Lastpage
    62
  • Abstract
    An on-chip sampling oscilloscope with lps timing resolution is realized in 90nm CMOS process based on a proposed ramp waveform division scheme for precise signal integrity and power-line integrity measurement. The resolution in time is variable from 1ps to 64ps in 64 steps. A novel on-chip inductance measurement procedure is also proposed
  • Keywords
    CMOS integrated circuits; inductance measurement; oscilloscopes; ramp generators; timing circuits; 1 to 64 ps; CMOS process; on-chip inductance measurement; on-chip sampling oscilloscope; power-line integrity measurement; ramp waveform division scheme; signal integrity; timing resolution; Clocks; Crosstalk; Oscilloscopes; Sampling methods; Semiconductor device measurement; Semiconductor device noise; Signal generators; Signal resolution; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 2006. Digest of Technical Papers. 2006 Symposium on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    1-4244-0006-6
  • Type

    conf

  • DOI
    10.1109/VLSIC.2006.1705312
  • Filename
    1705312
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2627286