Title :
In-Situ Measurement of Supply-Noise Maps with Millivolt Accuracy and Nanosecond-Order Time Resolution
Author :
Kanno, Yusuke ; Kondoh, Yuki ; Irita, Takahiro ; Hirose, Kenji ; Mori, Ryo ; Yasu, Yoshihiko ; Komatsu, Shigenobu ; Mizuno, Hiroyuki
Author_Institution :
Central Res. Lab., Hitachi, Ltd., Tokyo
Abstract :
An in-situ measurement scheme for supply-noise maps under running applications in product-level LSIs was developed. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G cellular phone processor. It will thus help in designing power-supply networks and visibly verifying the quality of a power supply
Keywords :
3G mobile communication; integrated circuit measurement; integrated circuit noise; large scale integration; microprocessor chips; 3G cellular phone processor; 5 ns; 69 mV; in-situ measurement; local supply noise; millivolt accuracy; nanosecond-order timing resolution; network design; power supply quality; product-level LSI; supply-noise map measurement; Calibration; Cellular phones; Noise measurement; Oscilloscopes; Power supplies; Probes; Ring oscillators; Semiconductor device measurement; Time measurement; Voltage;
Conference_Titel :
VLSI Circuits, 2006. Digest of Technical Papers. 2006 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-0006-6
DOI :
10.1109/VLSIC.2006.1705313
