In-Situ Measurement of Supply-Noise Maps with Millivolt Accuracy and Nanosecond-Order Time Resolution

Author

Kanno, Yusuke ; Kondoh, Yuki ; Irita, Takahiro ; Hirose, Kenji ; Mori, Ryo ; Yasu, Yoshihiko ; Komatsu, Shigenobu ; Mizuno, Hiroyuki

Author_Institution

Central Res. Lab., Hitachi, Ltd., Tokyo

fYear

0

fDate

0-0 0

Firstpage

63

Lastpage

64

Abstract

An in-situ measurement scheme for supply-noise maps under running applications in product-level LSIs was developed. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G cellular phone processor. It will thus help in designing power-supply networks and visibly verifying the quality of a power supply

Keywords

3G mobile communication; integrated circuit measurement; integrated circuit noise; large scale integration; microprocessor chips; 3G cellular phone processor; 5 ns; 69 mV; in-situ measurement; local supply noise; millivolt accuracy; nanosecond-order timing resolution; network design; power supply quality; product-level LSI; supply-noise map measurement; Calibration; Cellular phones; Noise measurement; Oscilloscopes; Power supplies; Probes; Ring oscillators; Semiconductor device measurement; Time measurement; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 2006. Digest of Technical Papers. 2006 Symposium on

Conference_Location

Honolulu, HI

Print_ISBN

1-4244-0006-6

Type

conf

DOI

10.1109/VLSIC.2006.1705313

Filename

1705313