Title :
Voltage dip immunity aspects of power-electronics equipment — Recommendations from CIGRE/CIRED/UIE JWG C4.110
Author :
Bollen, Math H J ; Cundeva, Snezana ; Gordon, José-Maria Romero ; Djokic, Sasa Z. ; Stockman, Kurt ; Milanovic, Jovica V. ; Neumann, Robert ; Ethier, Gaetan
Author_Institution :
STRI AB, Gothenburg, Sweden
Abstract :
This paper presents some of the results from an international working group on voltage-dip immunity. The working group has made a number of recommendations to reduce the adverse impact of voltage dips. Specific recommendations to researchers and manufacturers of power-electronic equipment are: considering all voltage dip characteristics early in the design of equipment; characterize performance of equipment by means of voltage-dip immunity curves; and made equipment with different immunity available.
Keywords :
power electronics; power supply quality; CIGRE/CIRED/UIE JWG C4.110; adverse impact reduction; international joint working group; power electronics equipment; voltage dip immunity; Circuit faults; Economics; Immunity testing; Voltage control; Voltage fluctuations; Voltage measurement; Power quality; electromagnetic compatibility; power distribution networks;
Conference_Titel :
Power Electronics and Motion Control Conference (EPE/PEMC), 2010 14th International
Conference_Location :
Ohrid
Print_ISBN :
978-1-4244-7856-9
DOI :
10.1109/EPEPEMC.2010.5606512
