Title :
Measurements on the Properties of Microwave Integrated Circuits
Author :
Caulton, Martin ; Hershenov, Bernad ; Knight, Stanley P. ; Napoli, Louis S.
Abstract :
Microwave integrated circuits (MIC) using low-impedance high-power devices demand high-Q components. In addition, MIC using both lumped and distributed (microstrip) elements are finding applications at frequencies well above S-band. It is the purpose of this paper to describe some recent measurements on circuit properties consisting of: (1) the reactance and Q of lumped-elements at frequencies above S-band, and (2) the dispersive characteristics of microstrip transmission lines.
Keywords :
Dispersion; Distributed parameter circuits; Frequency measurement; Integrated circuit measurements; Microstrip; Microwave devices; Microwave integrated circuits; Microwave measurements; Q measurement; Transmission line measurements;
Conference_Titel :
Microwave Symposium, 1969 G-MTT International
Conference_Location :
Dallas TX, USA
DOI :
10.1109/GMTT.1969.1122655
