• DocumentCode
    2627623
  • Title

    Image-based texture analysis for realistic image synthesis

  • Author

    Mayer, Heinz

  • Author_Institution
    Comput. Graphics & Vision, Graz Univ. of Technol., Austria
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    219
  • Lastpage
    226
  • Abstract
    We present a method to measure reflectance and texture of surfaces in a one step process. For later use in digital image synthesis, it is mandatory to separate the gathered intensity values into these two parts to eliminate highlighting artifacts from textures. Our image based measurement system delivers bidirectional reflectance distribution function (BRDF) values distributed over the surface of the material under investigation. After fitting a reflectance model to the gathered data, we estimate the modulation of the diffuse reflectance coefficient which represents the texture. The last step analyzes the texture to get a parameterized and compact description of the measured surface properties. These results allow us to apply the gathered surface properties to objects with arbitrary shape and size. To keep the measurement system simple, a standard CCD camera and light source are used
  • Keywords
    image texture; realistic images; reflectivity; rendering (computer graphics); BRDF values; arbitrary shape; bidirectional reflectance distribution function; compact description; diffuse reflectance coefficient; digital image synthesis; highlighting artifacts; image based measurement system; image based texture analysis; intensity values; light source; measured surface properties; measurement system; realistic image synthesis; reflectance model; standard CCD camera; surface reflectance; Bidirectional control; Digital images; Distribution functions; Image analysis; Image generation; Image texture analysis; Reflectivity; Shape; Surface fitting; Surface texture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Graphics and Image Processing, 2000. Proceedings XIII Brazilian Symposium on
  • Conference_Location
    Gramado
  • ISSN
    1530-1834
  • Print_ISBN
    0-7695-0878-2
  • Type

    conf

  • DOI
    10.1109/SIBGRA.2000.883916
  • Filename
    883916