Title :
A study of the robustness of pseudo random binary array based surface characterization
Author :
Spoelder, H.J.W. ; Vos, Frans M. ; Petriu, E.M. ; Groen, F.C.A.
Author_Institution :
Dept. of Phys. & Astron., Vrije Univ., Amsterdam, Netherlands
Abstract :
In this article we report on aspects of the use of colour coded Pseudo Random Binary Arrays (PRBA´s) to model three dimensional scenes. We will evaluate the accuracy and the robustness of the pattern recognition phase in the process. Emphasis will be on the added value of the use of PRBA´s as a tool to make the image processing robust and highly noise insensitive
Keywords :
Hamming codes; binary sequences; computational geometry; data visualisation; image coding; image colour analysis; image reconstruction; image sequences; surface fitting; 3D scenes modelling; Voronoi triangulation; added value; average Hamming distance; binary sequences; colour coded arrays; graph reconstruction; highly noise insensitive; image processing; pattern recognition phase; positional recovery; pseudo random binary array; robustness; structured light techniques; surface characterization; world coordinates; Astronomy; Binary sequences; Cornea; Image reconstruction; Layout; Mathematics; Noise robustness; Physics; Shape measurement; Vectors;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-3747-6
DOI :
10.1109/IMTC.1997.610192
