DocumentCode :
2627763
Title :
Expression of individual woven yarn of textile fabric by clustering three dimensional CT image using mahalanobis distance
Author :
Shinohara, Toshihiro
Author_Institution :
Dept. of Comput. Syst. Biol., Kinki Univ., Wakayama, Japan
fYear :
2012
fDate :
25-28 Oct. 2012
Firstpage :
1505
Lastpage :
1510
Abstract :
In this paper, a method to express individual woven yarns is proposed for structure analysis of a textile fabric with its three-dimensional (3D) X-ray computed tomography (CT) image. In this method, the voxels of the 3D CT image are segmented into each yarn by using the yarn positional information, which is a sequence of the yarn center points. The positional information is obtained by tracing the yarn. The yarn is traced by sequentially estimating its center and orientation. The center and orientation are estimated by correlating the voxel values with a solid model of the yarn. The voxels of the 3D CT image are segmented into each yarn based on a clustering method using the Mahalanobis distance between the voxel and the obtained yarn positional information. Each individual yarn is expressed by the volume-rendering technique with the segmented voxels. The effectiveness of the proposed yarn expression method is confirmed by experimentally applying this method to the 3D image of a plain knitted fabric.
Keywords :
computerised tomography; fabrics; image segmentation; inspection; production engineering computing; rendering (computer graphics); solid modelling; textile technology; woven composites; yarn; 3D CT image segmentation; Mahalanobis distance; X-ray computed tomography; clustering method; plain knitted fabric; solid model; structure analysis; textile fabric; three dimensional CT image; volume-rendering technique; voxel value; woven yarn; yarn center point; yarn expression method; yarn positional information; Computed tomography; Fabrics; Facsimile; Weaving; Yarn;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society
Conference_Location :
Montreal, QC
ISSN :
1553-572X
Print_ISBN :
978-1-4673-2419-9
Electronic_ISBN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2012.6388519
Filename :
6388519
Link To Document :
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