DocumentCode :
2627779
Title :
Measurement of on-chip transmission-line with stacked split-ring resonators
Author :
Tsuchiya, Akira ; Onodera, Hidetoshi
Author_Institution :
Depertment of Commun. & Comupter Eng., Kyoto Univ., Kyoto, Japan
fYear :
2010
fDate :
9-12 May 2010
Firstpage :
137
Lastpage :
140
Abstract :
This paper reports measurement results of on-chip transmission-line with split-ring resonators. Split-ring resonator (SRR) has attracted attention as an implementation of metamaterial (left-handed material). However when simple SRR is implemented in LSIs, the resonance frequency becomes around 200GHz and it is too high to employ on on-chip circuits. We designed a stacked SRR to lower the resonant frequency in a 0.18μm CMOS. Measurement results show that the stacked SRRs can realize the resonance frequency below 50GHz. Also measurement results show a guideline of area effective implementation of on-chip SRR.
Keywords :
CMOS integrated circuits; circuit resonance; resonators; transmission lines; CMOS process; on-chip SRR; on-chip circuit; on-chip transmission-line; resonance frequency; size 0.18 mum; stacked split-ring resonator; Area measurement; CMOS process; Guidelines; Metamaterials; Microwave devices; Millimeter wave integrated circuits; Resonance; Resonant frequency; Shape measurement; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Propagation on Interconnects (SPI), 2010 IEEE 14th Workshop on
Conference_Location :
Hildesheim
Print_ISBN :
978-1-4244-7611-4
Type :
conf
DOI :
10.1109/SPI.2010.5483544
Filename :
5483544
Link To Document :
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