• DocumentCode
    262781
  • Title

    Big data and test

  • Author

    Gattiker, Anne

  • Author_Institution
    IBM, USA
  • fYear
    2014
  • fDate
    20-23 Oct. 2014
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Big data is now a ubiquitous part of life — both in test and in many other areas. This talk discusses some of the big problems facing us in test and looks at analogous problems outside of the test domain. It aims to both step back and abstract test-specific problems into general problems and point out similarities and contrasts between test and non-test problems. It also highlights interesting aspects of applying some test-like techniques in non-test settings such as cognitive computing.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2014 IEEE International
  • Conference_Location
    Seattle, WA, USA
  • Type

    conf

  • DOI
    10.1109/TEST.2014.7035327
  • Filename
    7035327