DocumentCode
262781
Title
Big data and test
Author
Gattiker, Anne
Author_Institution
IBM, USA
fYear
2014
fDate
20-23 Oct. 2014
Firstpage
1
Lastpage
1
Abstract
Big data is now a ubiquitous part of life — both in test and in many other areas. This talk discusses some of the big problems facing us in test and looks at analogous problems outside of the test domain. It aims to both step back and abstract test-specific problems into general problems and point out similarities and contrasts between test and non-test problems. It also highlights interesting aspects of applying some test-like techniques in non-test settings such as cognitive computing.
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2014 IEEE International
Conference_Location
Seattle, WA, USA
Type
conf
DOI
10.1109/TEST.2014.7035327
Filename
7035327
Link To Document