DocumentCode :
262781
Title :
Big data and test
Author :
Gattiker, Anne
Author_Institution :
IBM, USA
fYear :
2014
fDate :
20-23 Oct. 2014
Firstpage :
1
Lastpage :
1
Abstract :
Big data is now a ubiquitous part of life — both in test and in many other areas. This talk discusses some of the big problems facing us in test and looks at analogous problems outside of the test domain. It aims to both step back and abstract test-specific problems into general problems and point out similarities and contrasts between test and non-test problems. It also highlights interesting aspects of applying some test-like techniques in non-test settings such as cognitive computing.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2014 IEEE International
Conference_Location :
Seattle, WA, USA
Type :
conf
DOI :
10.1109/TEST.2014.7035327
Filename :
7035327
Link To Document :
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