DocumentCode :
262794
Title :
Knowledge discovery and knowledge transfer in board-level functional fault diagnosis
Author :
Fangming Ye ; Zhaobo Zhang ; Chakrabarty, Krishnendu ; Xinli Gu
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
fYear :
2014
fDate :
20-23 Oct. 2014
Firstpage :
1
Lastpage :
10
Abstract :
Diagnosis of functional failures at the board level is critical for improving product yield and reducing manufacturing cost. Reasoning techniques increase the accuracy of functional-fault diagnosis based on the history of successfully repaired boards. However, depending on the complexity of the product, it usually takes several months to accumulate an adequate database for training a reasoning-based diagnosis system. During the initial product ramp-up phase, reasoning-based diagnosis is not feasible for yield learning, since the required database is not available due to lack of volume. We propose a knowledge-discovery method and a knowledge-transfer method for facilitating board-level functional fault diagnosis. First, an analysis technique based on machine learning is used to discover knowledge from syndromes, which can be used for training a diagnosis engine. Second, knowledge from diagnosis engines used for earlier-generation products can be automatically transferred through root-cause mapping and syndrome mapping based on keywords and board-structure similarities. Two complex boards in volume production and with a mature diagnosis system, and three new boards in the ramp-up phase, are used to validate the proposed knowledge-discovery and knowledge-transfer approach in terms of the diagnosis accuracy obtained using the new diagnosis systems.
Keywords :
data mining; failure analysis; fault diagnosis; integrated circuit reliability; integrated circuit yield; printed circuits; board repair; board-level functional fault diagnosis; diagnosis engine; earlier-generation product; knowledge discovery method; knowledge transfer method; machine learning; manufacturing cost reduction; product ramp-up phase; product yield; reasoning technique; reasoning-based diagnosis system; root-cause mapping; syndrome mapping; yield learning; Application specific integrated circuits; Engines; Knowledge acquisition; Knowledge discovery; Knowledge transfer; Production; Training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2014 IEEE International
Conference_Location :
Seattle, WA
Type :
conf
DOI :
10.1109/TEST.2014.7035335
Filename :
7035335
Link To Document :
بازگشت