Automatized methods for optimization of scanning probe microscope operation

Semicontact mode is one of most popular and prospective mode in atomic-force microscopy. It means that scanning is done by probe (cantilever) oscillating near the sample surface. This method is widely used in most scanning probe microscope (SPM) applications - polymers, biology, medicine, films etc. But selection of interaction regime of probe with sample and scanning parameters setup influence substantially on resolution and "validity" (artifacts absence) of results. Regimes analysis is also in a key point for reducing the risk of probe and sample damage. It becomes very important with appearing expensive super-tips.