Title :
Statistical features selection from intrinsic mode functions for pathologies detection in retina digital images
Author :
Lahmiri, Salim ; Gargour, Christian ; Gabrea, Marcel
Author_Institution :
Dept. of Electr. Eng., Ecole de Technol. Supreireure, Montreal, QC, Canada
Abstract :
The empirical mode decomposition (EMD) is employed to analyze retina digital images in the frequency domain and statistical features are extracted from high frequency components of the analyzed images. The purpose is to classify normal versus abnormal images. Three different pathologies are considered including, circinates, drusens, and microaneurysms (MA). The most informative and non redundant features are ranked and selected by use of statistical features selection techniques; namely t-statistic, entropy, Battacharrayia statistic, the area between the receiver operating characteristic (ROC) and principal component analysis (PCA). Finally, support vector machines (SVM) with polynomial and radial basis function (RBF) kernels are used to classify retina digital images based on the selected features. The simulation results from leave-one-out method (LOOM) show the effectiveness of the EMD-Battacharrayia-SVM achieves 96.54%±0.0293 correct classification rate. Thus, features selection helps improving the accuracy of our system designed for pathologies detection in retina.
Keywords :
biomedical optical imaging; entropy; eye; feature extraction; frequency-domain analysis; image classification; medical image processing; principal component analysis; radial basis function networks; sensitivity analysis; support vector machines; Battacharrayia statistic; PCA; ROC; SVM; circinates; drusens; empirical mode decomposition; entropy; frequency domain; high frequency components; image classification; intrinsic mode functions; leave-one-out method; microaneurysms; optical imaging; pathologies detection; polynomial basis function kernels; principal component analysis; radial basis function kernels; receiver operating characteristic; retina digital image analysis; statistical feature extraction; statistical features selection; support vector machines; t-statistics; Accuracy; Discrete wavelet transforms; Entropy; Retina; Support vector machines;
Conference_Titel :
IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-2419-9
Electronic_ISBN :
1553-572X
DOI :
10.1109/IECON.2012.6388532