Title :
Modeling the ion-exchange process to support the manufacturing of optical multimode graded-index waveguides in thin glass sheets
Author :
Kühler, Thomas ; Griese, Elmar
Author_Institution :
Theor. Electr. Eng. & Photonics, Univ. of Siegen, Siegen, Germany
Abstract :
Realizing electrical printed circuit boards with integrated optical interconnects for high bandwidth interconnects requires numerical models and algorithms for analyzing and optimising process parameters. In this paper an approach for the numerical computation of the refractive index profile of waveguides manufactored by ion-exchange processes is presented.
Keywords :
integrated optics; ion exchange; optical interconnections; optical waveguides; optoelectronic devices; electrical printed circuit boards; high bandwidth interconnects; integrated optical interconnects; ion-exchange process; numerical computation; optical multimode graded-index waveguide manufacturing; refractive index profile; thin glass sheets; Bandwidth; Glass manufacturing; Integrated circuit interconnections; Manufacturing processes; Optical interconnections; Optical refraction; Optical variables control; Optical waveguides; Printed circuits; Virtual manufacturing;
Conference_Titel :
Signal Propagation on Interconnects (SPI), 2010 IEEE 14th Workshop on
Conference_Location :
Hildesheim
Print_ISBN :
978-1-4244-7611-4
DOI :
10.1109/SPI.2010.5483566
