Title :
EAGLE: A regression model for fault coverage estimation using a simulation based metric
Author :
Mirkhani, Shahrzad ; Abraham, Jacob A.
Author_Institution :
Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX, USA
Abstract :
Evaluating the fault coverage of manufacturing tests has become a time-consuming process due to today´s large and complex digital designs. The computation cost is even more pronounced in software-based self test, on-line test, and logic BIST schemes, which require fault simulation of sequential circuits. In this paper, we build a regression model for estimating stuck-at fault coverage. This model is built based on partial fault simulation along with a statistical metric, which is calculated by a single pass of fault-free simulation. Our results on ISCAS´85, ISCAS´89, and the OR1200 processor show that by only fault simulating 7.6% of the test vectors, on average, over 94% of the fault coverage bounds are estimated correctly.
Keywords :
fault diagnosis; integrated circuit testing; logic testing; regression analysis; EAGLE; fault coverage estimation; linear regression-based fault coverage estimation; manufacturing tests; regression model; simulation based metric; stuck-at fault coverage; Circuit faults; Correlation; Estimation; Integrated circuit modeling; Linear regression; Measurement; Vectors;
Conference_Titel :
Test Conference (ITC), 2014 IEEE International
Conference_Location :
Seattle, WA
DOI :
10.1109/TEST.2014.7035347