• DocumentCode
    262819
  • Title

    Comparing the effectiveness of cache-resident tests against cycleaccurate deterministic functional patterns

  • Author

    Gurumurthy, Sankar ; Pratapgarhwala, Mustansir ; Gilgan, Curtis ; Rearick, Jeff

  • Author_Institution
    Adv. Micro Devices, Inc., Austin, TX, USA
  • fYear
    2014
  • fDate
    20-23 Oct. 2014
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper provides an overview of a flow to generate and apply cache-resident self-test (CReST) patterns on a CPU as an alternative to deterministic functional patterns. This paper also compares CReST patterns against deterministic functional patterns, including the results of a case study of applying both CReST and deterministic functional patterns on commercially available AMD x86 processors in high-volume production. The experiment indicates that CReST patterns are an effective substitute for functional patterns.
  • Keywords
    built-in self test; cache storage; AMD x86 processors; CPU; CReST patterns; cache-resident self-test patterns; deterministic functional patterns; Abstracts; Hardware; IP networks; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2014 IEEE International
  • Conference_Location
    Seattle, WA
  • Type

    conf

  • DOI
    10.1109/TEST.2014.7035348
  • Filename
    7035348
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=262819