Title :
Comparing the effectiveness of cache-resident tests against cycleaccurate deterministic functional patterns
Author :
Gurumurthy, Sankar ; Pratapgarhwala, Mustansir ; Gilgan, Curtis ; Rearick, Jeff
Author_Institution :
Adv. Micro Devices, Inc., Austin, TX, USA
Abstract :
This paper provides an overview of a flow to generate and apply cache-resident self-test (CReST) patterns on a CPU as an alternative to deterministic functional patterns. This paper also compares CReST patterns against deterministic functional patterns, including the results of a case study of applying both CReST and deterministic functional patterns on commercially available AMD x86 processors in high-volume production. The experiment indicates that CReST patterns are an effective substitute for functional patterns.
Keywords :
built-in self test; cache storage; AMD x86 processors; CPU; CReST patterns; cache-resident self-test patterns; deterministic functional patterns; Abstracts; Hardware; IP networks; Registers;
Conference_Titel :
Test Conference (ITC), 2014 IEEE International
Conference_Location :
Seattle, WA
DOI :
10.1109/TEST.2014.7035348
