DocumentCode :
26283
Title :
Optimization of Interstrand Coupling Loss and Transverse Load Degradation in ITER \\hbox {Nb}_{3}\\hbox {Sn} CICCs
Author :
Nijhuis, A. ; Rolando, G. ; Zhou, Changle ; van Lanen, E.P.A. ; van Nugteren, J. ; Pompe van Meerdervoort, R.P. ; Krooshoop, H.J.G. ; Wessel, W.A.J. ; Devred, Arnaud ; Vostner, Alexander ; Pong, I.
Author_Institution :
Univ. of Twente, Enschede, Netherlands
Volume :
23
Issue :
3
fYear :
2013
fDate :
Jun-13
Firstpage :
4201206
Lastpage :
4201206
Abstract :
For the ITER Central Solenoid (CS), with Nb3Sn CICCs that operate under fast ramping conditions, the selection of the twist pitch lengths can have a significant impact on the performance. The critical current and temperature margin are influenced by the thermal contraction of the composite materials, the transverse electromagnetic forces, and coupling currents. The numerical cable model JackPot-ACDC is developed to calculate the interstrand coupling loss for any time-dependent current and magnet field for all strand trajectories in a CICC. It was a priori predicted that the amount of coupling loss and critical current degradation is subject to interference due to different subcable twist pitches. Here test results are discussed of the ITER CS conductor sample, manufactured according to the proposed design, optimizing the transverse load degradation, the temperature margin, and the coupling loss.
Keywords :
Tokamak devices; composite materials; critical currents; electromagnetic forces; niobium alloys; plasma toroidal confinement; plasma transport processes; superconducting device testing; superconducting magnets; superconducting transition temperature; tin alloys; type II superconductors; CICC; ITER central solenoid; Nb3Sn; composite materials; coupling currents; critical current degradation; interstrand coupling loss; numerical cable model JackPot-ACDC; ramping conditions; thermal contraction; time-dependent current; time-dependent magnet field; transverse electromagnetic forces; transverse load degradation; twist pitch lengths; Conductors; Couplings; Degradation; Integrated circuits; Loss measurement; Niobium-tin; Strain; CICC; CJackPot; ITER; S coil; coupling loss;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2012.2235894
Filename :
6419783
Link To Document :
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