DocumentCode :
2628453
Title :
Multiport measurement and deembedding techniques for crosstalk study in via arrays
Author :
Kotzev, Miroslav ; Rimolo-Donadio, Renato ; Brüns, Heinz-Dietrich ; Schuster, Christian
Author_Institution :
Inst. fur Theor. Elektrotechnik, Tech. Univ. Hamburg-Harburg, Hamburg, Germany
fYear :
2010
fDate :
9-12 May 2010
Firstpage :
47
Lastpage :
50
Abstract :
In this paper the authors present techniques for crosstalk measurements in via arrays using broadband microprobes and a multiport vector network analyzer. The desegmentation method is used for probe deembedding in the bandwidth from 10 MHz up to 50 GHz. In contrast to the common approach which relies on T-matrices the desegmentation procedure ensures flexible fixture extraction using directly the S-parameter or Z-parameter matrices of the multiport network that has to be deembedded. The main advantage of the deembedding by desegmentation technique is that it does not require any S- to T-parameters conversion and if desired allows stepwise extraction of the embedded error networks. A typical application of the desegmentation method is presented by the authors where in the case of microprobe based measurement the error boxes of the microprobes are obtained at first by the use of a two-tier calibration technique and in the next step the desegmentation is applied to remove their detrimental effect on the measurement data.
Keywords :
S-parameters; crosstalk; matrix algebra; two-port networks; S-parameter matrices; Z-parameter matrices; bandwidth 10 MHz to 50 GHz; broadband microprobe; crosstalk measurement; deembedding technique; desegmentation method; multiport measurement; multiport vector network analyzer; two-tier calibration technique; Bandwidth; Calibration; Crosstalk; Data mining; Electronic mail; Fixtures; Frequency measurement; Probes; Scattering parameters; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Propagation on Interconnects (SPI), 2010 IEEE 14th Workshop on
Conference_Location :
Hildesheim
Print_ISBN :
978-1-4244-7611-4
Type :
conf
DOI :
10.1109/SPI.2010.5483580
Filename :
5483580
Link To Document :
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