• DocumentCode
    2628646
  • Title

    Measurement of on-chip I/O power supply noise and correlation verification between noise magnitude and delay increase due to SSO

  • Author

    Takai, Yasumichi ; Ogasahara, Yasuhiro ; Hashimoto, Masanori ; Onoye, Takao

  • Author_Institution
    Dept. Inf. Syst. Eng., Osaka Univ., Suita, Japan
  • fYear
    2010
  • fDate
    9-12 May 2010
  • Firstpage
    19
  • Lastpage
    20
  • Abstract
    This paper presents measurement results of on-chip noise on power and ground rings for I/O (input/output) cells in a simple test structure fabricated in 90nm process. We also show measured timings of an output signal from chip to PCB board, and examine the relation between the magnitude of I/O power supply noise and the output transition timings.
  • Keywords
    Clocks; Delay; Noise measurement; Phase locked loops; Pins; Power measurement; Power supplies; Probes; Semiconductor device measurement; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Propagation on Interconnects (SPI), 2010 IEEE 14th Workshop on
  • Conference_Location
    Hildesheim, Germany
  • Print_ISBN
    978-1-4244-7611-4
  • Type

    conf

  • DOI
    10.1109/SPI.2010.5483591
  • Filename
    5483591
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2628646