DocumentCode
262884
Title
Study on the electrical properties and defect structures of a high voltage gradient ZnO varistor
Author
Xuetong Zhao ; Ruijin Liao ; Kanglin Liu ; Feipeng Wang ; Jianying Li
Author_Institution
State Key Lab. of Power Transm. Equip. & Syst. Security & New Technol., Chongqing Univ., Chongqing, China
fYear
2014
fDate
8-11 Sept. 2014
Firstpage
1
Lastpage
4
Abstract
In this research, ZnO-based varistor ceramics with different recipes were obtained. It was found that the grain growth can be effectively restrained with the addition of Ba2+ and the decrease of sintering temperature. SEM results indicate that the grain size of ZnO varistor ceramics sintering at 950 °C was reduced to 1.28 μm, which is about 8 times smaller than that of ordinary ZnO varistor ceramics. Correspondingly, the voltage gradient of the ZnO varistor samples were also extremely enhanced to 3845 V/mm. The dielectric properties of the ZnO varistor ceramics were measured by Broadband Dielectric Spectroscopy. The results showed that two dielectric loss peaks with activation energy at about 0.22 eV and 0.36 eV observed in 163-203 K are common for all the ZnO varistor samples, which were considered to be consistent with the electronic levels of intrinsic defect interstitial zinc and vacancy oxygen in the depletion layer. However, for sample C, the dielectric loss was reduced greatly in low frequency range with the addition of Ba2+ and the resistance of grain boundary increased to 128 MΩ at 473 K. Therefore, it was proposed that the addition of Ba2+ and the sintering procedure may play a great role in improving the electrical properties of ZnO varistors.
Keywords
II-VI semiconductors; dielectric loss measurement; grain boundaries; grain growth; grain size; scanning electron microscopy; sintering; varistors; zinc compounds; SEM; ZnO; ZnO-based varistor ceramics; broadband dielectric spectroscopy; defect structures; dielectric loss; dielectric properties measurement; electron volt energy 0.22 eV to 0.36 eV; electronic level; grain boundary; grain growth; grain size; intrinsic defect interstitial; resistance 128 Mohm; sintering procedure; sintering temperature; temperature 163 K to 203 K; temperature 473 K; temperature 950 degC; voltage gradient; Ceramics; Degradation; Impedance; Manganese; Temperature measurement; Varistors; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
High Voltage Engineering and Application (ICHVE), 2014 International Conference on
Conference_Location
Poznan
Type
conf
DOI
10.1109/ICHVE.2014.7035381
Filename
7035381
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