Title :
Removal of Eye Blink Artifacts From EEG Signals Based on Cross-Correlation
Author :
Yoo, Kil-Sang ; Basa, Tristan ; Lee, Won-Hyung
Author_Institution :
Chung-Ang Univ., Seoul
Abstract :
Artifacts such as eye blinks cause interference signals within electroencephalogram (EEG) measurements. Therefore, we propose a method for artifact removal based on certain power spectrum features of independent components extracted from the EEGs by fusing ensemble average and cross-corrasion parameter. First, each independent component which was assumed to be a source was searched by applying cross-corrasion parameter to EEG which involved artifacts relevant to the eye blinks of a normal person. Next, the signal which was assumed to be blink artifacts can be removed using high-pass filtering. The removal results of the eye blink artifacts are fed into the interpretation system.
Keywords :
electroencephalography; high-pass filters; medical signal processing; EEG signals; electroencephalogram measurements; eye blink artifacts removal; high-pass filtering; interpretation system; Data analysis; Electrodes; Electroencephalography; Electrooculography; Enterprise resource planning; Independent component analysis; Pollution measurement; Scalp; Signal generators; Voltage;
Conference_Titel :
Convergence Information Technology, 2007. International Conference on
Conference_Location :
Gyeongju
Print_ISBN :
0-7695-3038-9
DOI :
10.1109/ICCIT.2007.187