DocumentCode :
262895
Title :
Effect of thermal ageing on space charge characteristics of cross-linked polyethylene
Author :
Chenmeng Xiang ; Quan Zhou ; Wendou An ; Nengcheng Wu
Author_Institution :
State Key Lab. of Power Transm. Equip. & Syst. Security & New Technol., Chongqing Univ., Chongqing, China
fYear :
2014
fDate :
8-11 Sept. 2014
Firstpage :
1
Lastpage :
4
Abstract :
In order to understand the thermal ageing effect on space charge characteristics of XLPE in the strong DC field, accelerated thermal ageing tests were conducted on XLPE samples. In this study, dicumyl peroxide (DCP) and low density polyethylene (LDPE) was selected to prepare samples. The PEA method was utilized to measure the space charge distribution characteristics of aged samples under DC voltage (50kV/mm). The impact of ageing on the internal space charge evolution as well as the average space charge density was discussed. Experiments and analysis results show that thermal ageing induces negative charge traps to samples and increases both the deep and shallow charge traps. Furthermore, it indicates that space charges distribution and the average charge density reflect the insulation properties of samples. The internal structure of XLPE specimens is changed and the insulation properties of specimens degraded as the aging time prolonged. These results provide theoretical support for further research on the effect of the space charge characteristics on properties of the power cables.
Keywords :
XLPE insulation; life testing; power cable insulation; DCP; LDPE; PEA method; XLPE; accelerated thermal ageing tests; average space charge density; cross-linked polyethylene; deep charge traps; dicumyl peroxide; insulation properties; internal space charge evolution; low density polyethylene; negative charge traps; power cables; shallow charge traps; space charge characteristics; space charge distribution characteristics; strong DC field; Accelerated aging; Acoustics; Anodes; Cathodes; Space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Voltage Engineering and Application (ICHVE), 2014 International Conference on
Conference_Location :
Poznan
Type :
conf
DOI :
10.1109/ICHVE.2014.7035387
Filename :
7035387
Link To Document :
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