• DocumentCode
    2628961
  • Title

    Achieving Zero-Defects for Automotive Applications

  • Author

    Raina, Rajesh

  • Author_Institution
    Freescale Semiconductor
  • fYear
    2008
  • fDate
    28-30 Oct. 2008
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    This paper describes a comprehensive flow for achieving Zero Defect semiconductor chips in a costeffective manner. The focus is on Designed-In Quality achieved through harmonious deployment of defect prevention and defect detection methods during the chip design phase (i.e., through DFM and DFT). The paper also identifies opportunities for improving the Zero- Defect design flow.
  • Keywords
    Automobiles; Automotive applications; Automotive engineering; Biomedical equipment; Collaboration; Consumer products; Costs; Phase detection; Testing; Warranties;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.5483611
  • Filename
    5483611
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2628961