Title :
Achieving Zero-Defects for Automotive Applications
Author_Institution :
Freescale Semiconductor
Abstract :
This paper describes a comprehensive flow for achieving Zero Defect semiconductor chips in a costeffective manner. The focus is on Designed-In Quality achieved through harmonious deployment of defect prevention and defect detection methods during the chip design phase (i.e., through DFM and DFT). The paper also identifies opportunities for improving the Zero- Defect design flow.
Keywords :
Automobiles; Automotive applications; Automotive engineering; Biomedical equipment; Collaboration; Consumer products; Costs; Phase detection; Testing; Warranties;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.5483611
