• DocumentCode
    2629011
  • Title

    Finite-element thermal modeling of N-based HEMT structures

  • Author

    Costi, F. ; Bertoluzza, F. ; Delmonte, N. ; Sozzi, G. ; Menozzi, R.

  • Author_Institution
    University of Parma, Usberti, 181/A - Parma, Italy
  • fYear
    2008
  • fDate
    12-12 Oct. 2008
  • Firstpage
    15
  • Lastpage
    24
  • Abstract
    The aim of this paper is to show and discuss results of 3D finite-element thermal simulation of GaN HEMT structures. HEMTs differing by geometry, substrate material, passivation, and heat removal strategy are simulated and compared in order to give a picture of the complex interplay of factors that must be reckoned with for proper thermal management.
  • Keywords
    Aluminum gallium nitride; Boundary conditions; Fingers; Finite element methods; Gallium nitride; HEMTs; Passivation; Substrates; Temperature distribution; Thermal management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ROCS Workshop, 2008 [Reliability of Compound Semiconductors Workshop]
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    0-7908-0120-5
  • Type

    conf

  • DOI
    10.1109/ROCS.2008.5483614
  • Filename
    5483614