In-situ monitoring during vapour phase growth of bulk crystals of cadmium zinc telluride

In-situ laser reflectance measurements and photography have been made during the hetero-epitaxial nucleation and growth of cadmium zinc telluride on GaAs seeds. Fabry-Pèrot oscillations are observed in the reflectance signal which persist up to several tens of micrometres layer thickness and the average reflected intensity provides information on the surface morphology of the growing crystal.