DocumentCode :
2629048
Title :
Growth of high crystalline quality CdTe layers on 100 mm diameter Ge substrates for room temperature radiation detection
Author :
Cantwell, Benjamin J. ; Dierre, Fabrice ; Ayoub, Mohammed ; Mullins, John T. ; Pym, Alex T.G. ; Scott, Paul D. ; Radley, Ian ; Basu, Amab ; Jiang, Quanzhong ; Brinkman, Andrew W.
Author_Institution :
Kromek, Thomas Wright Way, Sedgfield, TS21 3FD, U.K.
fYear :
2008
fDate :
19-25 Oct. 2008
Firstpage :
146
Lastpage :
149
Abstract :
Uniform layers of cadmium telluride have been successfully grown hetero-epitaxially on germanium seeds up to 100 mm in diameter. X-ray diffraction studies show high structural quality for layers up to 1.4 mm thick. By doping with chlorine, resistivities up to 1 × 109 Ωcm have been achieved.
Keywords :
Cadmium compounds; Conductivity; Crystalline materials; Crystallization; Doping; Germanium; Nuclear and plasma sciences; Radiation detectors; Temperature; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location :
Dresden, Germany
ISSN :
1095-7863
Print_ISBN :
978-1-4244-2714-7
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2008.4775142
Filename :
4775142
Link To Document :
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