DocumentCode :
2629085
Title :
Development of 4-sides buttable CdTe-ASIC hybrid module for X-ray Flat Panel Detector
Author :
Tamaki, Mitsuru ; Mito, Yoshio ; Shuto, Yasuhiro ; Kiyuna, Tatsuya ; Yamamoto, Masaya ; Sagae, Kenichi ; Kina, Tooru ; Koizumi, Tatsuhiro ; Ohno, Ryoichi
Author_Institution :
Acrorad Co., Ltd, Okinawa, Japan
fYear :
2008
fDate :
19-25 Oct. 2008
Firstpage :
162
Lastpage :
165
Abstract :
The 4-sides buttable CdTe-ASIC hybrid module for X-ray Flat Panel Detector (FPD) has been developed by applying Through Silicon Via (TSV) technology to the readout ASIC. The ASIC has 128 × 256 channels of charge integration type readout circuit having the area of 12.9 mm × 25.7 mm. The CdTe sensor of 1 mm thickness, having the same area and pixel of 100 μm pitch, was fabricated from the Cl-doped CdTe single crystal grown by Traveling Heater Method (THM). Then the CdTe pixel sensor was hybridized with the ASIC using the bump-bonding technology. The basic performance of this 4-sides buttable module was evaluated by taking X-ray images, and it was compared with that of the commercially available indirect type CsI(Tl) FPD. A prototype CdTe FPD was made by assembling 9 pieces of the 4-sides buttable modules into 3 × 3 arrays in which the neighboring modules were mounted on the interface board with the gap less than 30 μm. The FPD covers an active area of 77 mm × 39 mm. The results showed the great potential of this 4-sides buttable module for the new real time X-ray FPD with high spatial resolution.
Keywords :
Application specific integrated circuits; Assembly; Prototypes; Silicon; Spatial resolution; Thermal sensors; Through-silicon vias; X-ray detection; X-ray detectors; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location :
Dresden, Germany
ISSN :
1095-7863
Print_ISBN :
978-1-4244-2714-7
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2008.4775145
Filename :
4775145
Link To Document :
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