A functional classification approach to layout analysis of document images

Author

Iwane, Kazumi ; Yamaoka, Masaki ; Iwaki, Osamu

Author_Institution

NTT Data Communications Systems Corp., Kawasaki, Kanagawa, Japan

fYear

1993

fDate

20-22 Oct 1993

Firstpage

778

Lastpage

781

Abstract

Layout analysis is both the segmentation and labeling of document images for automatic document input systems. The authors propose a layout analysis method based on a pattern classification scheme. They define the feature space in terms of low-level image processing features such as connected components and projection profiles. The classifier assigns each connected component its logical label according to its features. Publication specific information is kept in the reference vector dictionary. An experiment using technical journal title pages gives connected component level recognition rates of 95% and 81% for learning and unknown samples, respectively

Keywords

document image processing; feature extraction; image classification; image segmentation; automatic document input systems; connected components; document images; feature space; functional classification approach; labeling; layout analysis; learning; low-level image processing features; pattern classification scheme; projection profiles; publication-specific information; reference vector dictionary; segmentation; technical journal title pages; unknown samples; Character recognition; Humans; Image analysis; Image databases; Image segmentation; Labeling; Machine learning; Pattern analysis; Pattern classification; Text analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Document Analysis and Recognition, 1993., Proceedings of the Second International Conference on

Conference_Location

Tsukuba Science City

Print_ISBN

0-8186-4960-7

Type

conf

DOI

10.1109/ICDAR.1993.395622

Filename

395622