DocumentCode
2629305
Title
Global and local document degradation models
Author
Kanungo, Tapas ; Haralick, Robert M. ; Phillips, Ihsin
Author_Institution
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
fYear
1993
fDate
20-22 Oct 1993
Firstpage
730
Lastpage
734
Abstract
Two sources of document degradation are modeled: i) perspective distortion that occurs while photocopying or scanning thick, bound documents, and ii) degradation due to perturbations in the optical scanning and digitization process: speckle, blurr, jitter, thresholding. Perspective distortion is modeled by studying the underlying perspective geometry of the optical system of photocopiers and scanners. An illumination model is described to account for the nonlinear intensity change occuring across a page in a perspective-distorted document. The optical distortion process is modeled morphologically. First, a distance transform on the foreground is performed, followed by a random inversion of binary pixels where the probability of flip is a function of the distance of the pixel to the boundary of the foreground. Correlating the flipped pixels is modeled by a morphological closing operation
Keywords
computational geometry; document image processing; image scanners; mathematical morphology; photocopying; transforms; binary pixels; blurr; digitization process; distance transform; flip probability; flipped pixel correlation; foreground; global document degradation models; illumination model; jitter; local document degradation models; morphological closing operation; morphological modelling; nonlinear intensity change; optical scanning; perspective distortion; perspective geometry; perturbations; photocopying; random pixel inversion; speckle; thick, bound documents; thresholding; Adaptive optics; Degradation; Geometrical optics; Jitter; Lighting; Nonlinear distortion; Nonlinear optics; Optical distortion; Solid modeling; Speckle;
fLanguage
English
Publisher
ieee
Conference_Titel
Document Analysis and Recognition, 1993., Proceedings of the Second International Conference on
Conference_Location
Tsukuba Science City
Print_ISBN
0-8186-4960-7
Type
conf
DOI
10.1109/ICDAR.1993.395633
Filename
395633
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