• DocumentCode
    262933
  • Title

    Simulation of partial discharge in closely coupled cavities embedded in solid dielectrics by finite element method

  • Author

    Sarfi, V. ; Hemmati, V.

  • Author_Institution
    HV Lab./Moghan Wire & Cable Co., Shahrood, Iran
  • fYear
    2014
  • fDate
    8-11 Sept. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Nowadays, the existence of small gas-filled cavities in solid dielectric such as HV cables and transformers is difficult to avoid during manufacturing process, so detecting their effects on the equipments are very critical for the life of high voltage equipments. It is obvious that the simplest and most famous equivalent circuit of a solid dielectric with a cavity inside itself is the regular capacitance model. Simulation of PD for one cavity embedded in a solid dielectric indicates that calculation of voltage across the cavity using capacitance model must be modified because diameter of cavity and its distance to high or low voltage contacts have a big influence on cavity voltage in a solid dielectric [1]. In addition, in this paper, simulation of PD by finite element method (FEM) on two closely coupled cavities embedded in solid dielectrics shows that interactions between cavities are very important to illustrate the behavior of a cavity. Therefore, studies indicate that calculation of breakdown voltage in a cavity is completely dependent on locations of other cavities. Hence, using regular modeling for many cavities in a small area is not appropriate and it must be modified. This paper shows how Horizontal and vertical distance between two cavities has a big influence on breakdown voltage of a cavity.
  • Keywords
    dielectric materials; electrical contacts; equivalent circuits; finite element analysis; partial discharges; power apparatus; FEM; PD simulation; breakdown voltage; closely coupled cavity; equivalent circuit; finite element method; high voltage contacts; high voltage equipment; low voltage contacts; partial discharge simulation; regular capacitance model; solid dielectric equivalent circuit; Cavity resonators; Dielectrics; Finite element analysis; Integrated circuit modeling; Partial discharges; Solid modeling; Solids;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Voltage Engineering and Application (ICHVE), 2014 International Conference on
  • Conference_Location
    Poznan
  • Type

    conf

  • DOI
    10.1109/ICHVE.2014.7035406
  • Filename
    7035406