DocumentCode :
2629405
Title :
Load spectrum generation using probabilistic random process and fatigue life prediction for automobile muffler structure
Author :
Kwon, Jung-Ho ; Joo, Seon-Young ; Hwang, Kyung-Jung ; Shin, Jeong Woo ; Kim, Tae Wook
Author_Institution :
Dept. of Aerosp. Eng., Univ. of Ulsan, Ulsan
fYear :
2008
fDate :
23-29 June 2008
Firstpage :
53
Lastpage :
57
Abstract :
The simulated load spectrum is constituted for the automobile muffler structure using probabilistic random process with the measured load data. By applying obtained spectrum load and evaluating residual strength degradation and failure probability, its fatigue life is assessed on the basis of two parameter Weibull distribution. To determine the required strength degradation model parameters, experimental tests of fatigue life are also performed on the welded specimens with same condition as real muffler structure, and the result of specimen tests are processed using the maximum likelihood method.
Keywords :
Weibull distribution; automobiles; automotive components; exhaust systems; fatigue; maximum likelihood estimation; mechanical strength; random processes; silencers; welds; Weibull distribution; automobile muffler structure; failure probability; fatigue life prediction; maximum likelihood method; probabilistic random process; residual strength degradation; simulated load spectrum; welded specimens; Aerospace materials; Automobiles; Automotive materials; Degradation; Exhaust systems; Fatigue; Life testing; Performance evaluation; Random processes; Welding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Strategic Technologies, 2008. IFOST 2008. Third International Forum on
Conference_Location :
Novosibirsk-Tomsk
Print_ISBN :
978-1-4244-2319-4
Electronic_ISBN :
978-1-4244-2320-0
Type :
conf
DOI :
10.1109/IFOST.2008.4602923
Filename :
4602923
Link To Document :
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