DocumentCode
2629414
Title
On the failure mechanism of metallized polypropylene pulse capacitors
Author
Fuchang, Lin ; Xin, Dai ; Jin, Li ; Zonggan, Yao ; Nanya, Wang
Author_Institution
Huazhong Univ. of Sci. & Technol., Wuhan, China
Volume
2
fYear
2000
fDate
2000
Firstpage
592
Abstract
Metallized pulse capacitors has gained wider and wider usage because of their unique “self-healing” character. Their failure mechanism has many differences from film/foil capacitors. Experiments were carried out on a number of metallized polypropylene pulse capacitors in order to understand their failure mechanism better. Using some model Metallized Polypropylene capacitors manufactured under different production parameters, it is observed that the failure mechanism is influenced by thermal disposal temperature, vapor deposited metal, electrode-end spray condition, and current density of electrode-end. Breakdown, electrode-end degradation and excessive capacitance loss mainly cause the failure of metallized polypropylene pulse capacitors under high electric stress
Keywords
capacitors; failure analysis; metallisation; polymer films; current density; electric breakdown; electric stress; electrode end; failure mechanism; metallized polypropylene pulse capacitor; self-healing; spray condition; thermal disposal temperature; vapor deposited metal; Capacitors; Current density; Electric breakdown; Failure analysis; Metallization; Production; Temperature; Thermal degradation; Thermal spraying; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 2000 Annual Report Conference on
Conference_Location
Victoria, BC
Print_ISBN
0-7803-6413-9
Type
conf
DOI
10.1109/CEIDP.2000.884029
Filename
884029
Link To Document