DocumentCode :
2629414
Title :
On the failure mechanism of metallized polypropylene pulse capacitors
Author :
Fuchang, Lin ; Xin, Dai ; Jin, Li ; Zonggan, Yao ; Nanya, Wang
Author_Institution :
Huazhong Univ. of Sci. & Technol., Wuhan, China
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
592
Abstract :
Metallized pulse capacitors has gained wider and wider usage because of their unique “self-healing” character. Their failure mechanism has many differences from film/foil capacitors. Experiments were carried out on a number of metallized polypropylene pulse capacitors in order to understand their failure mechanism better. Using some model Metallized Polypropylene capacitors manufactured under different production parameters, it is observed that the failure mechanism is influenced by thermal disposal temperature, vapor deposited metal, electrode-end spray condition, and current density of electrode-end. Breakdown, electrode-end degradation and excessive capacitance loss mainly cause the failure of metallized polypropylene pulse capacitors under high electric stress
Keywords :
capacitors; failure analysis; metallisation; polymer films; current density; electric breakdown; electric stress; electrode end; failure mechanism; metallized polypropylene pulse capacitor; self-healing; spray condition; thermal disposal temperature; vapor deposited metal; Capacitors; Current density; Electric breakdown; Failure analysis; Metallization; Production; Temperature; Thermal degradation; Thermal spraying; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2000 Annual Report Conference on
Conference_Location :
Victoria, BC
Print_ISBN :
0-7803-6413-9
Type :
conf
DOI :
10.1109/CEIDP.2000.884029
Filename :
884029
Link To Document :
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