• DocumentCode
    2629414
  • Title

    On the failure mechanism of metallized polypropylene pulse capacitors

  • Author

    Fuchang, Lin ; Xin, Dai ; Jin, Li ; Zonggan, Yao ; Nanya, Wang

  • Author_Institution
    Huazhong Univ. of Sci. & Technol., Wuhan, China
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    592
  • Abstract
    Metallized pulse capacitors has gained wider and wider usage because of their unique “self-healing” character. Their failure mechanism has many differences from film/foil capacitors. Experiments were carried out on a number of metallized polypropylene pulse capacitors in order to understand their failure mechanism better. Using some model Metallized Polypropylene capacitors manufactured under different production parameters, it is observed that the failure mechanism is influenced by thermal disposal temperature, vapor deposited metal, electrode-end spray condition, and current density of electrode-end. Breakdown, electrode-end degradation and excessive capacitance loss mainly cause the failure of metallized polypropylene pulse capacitors under high electric stress
  • Keywords
    capacitors; failure analysis; metallisation; polymer films; current density; electric breakdown; electric stress; electrode end; failure mechanism; metallized polypropylene pulse capacitor; self-healing; spray condition; thermal disposal temperature; vapor deposited metal; Capacitors; Current density; Electric breakdown; Failure analysis; Metallization; Production; Temperature; Thermal degradation; Thermal spraying; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2000 Annual Report Conference on
  • Conference_Location
    Victoria, BC
  • Print_ISBN
    0-7803-6413-9
  • Type

    conf

  • DOI
    10.1109/CEIDP.2000.884029
  • Filename
    884029