The research of polarization in CdTe P-I-N detectors of nuclear radiation

CdTe detectors with P-I-N structure are widely used nowadays for x-ray and gamma-ray detection. The distinctive feature of CdTe detectors with P-I-N structure is low amount of dark current in detectors and high level of detector’s bias voltage. This trait allows to obtain very useful points of measurement for spectroscopic characterization. However, instability of detector characteristics in time, caused by polarization, restricts their practical application. In this paper the results of investigation of methods for decreasing of polarization effect influence to detector’s characteristics are presented.