Title :
Aging of ceramic materials used in power electronic substrates
Author :
Malec, D. ; Dinculescu, S. ; Lebey, T.
Author_Institution :
Lab. de Genie Electr., Univ. Paul Sabatier, Toulouse, France
Abstract :
In power electronics, the development of new IGBT power modules allows them to switch kV and kA during μs. However, such components need to be cooled and ceramic materials like AlN and Al2O3 are used as an interface between the electronic devices (the chips) and the cooling. Such materials have to present very well known electrical and thermal characteristics since the reliability of the inverters these components are used in is strongly depending on them. In order to increase the knowledge of the physical mechanisms involved during their aging, different experiments are performed (lifetime, breakdown, PD and Space charge measurements...). Electrofracture mechanism is claimed to be responsible of the observed behaviors
Keywords :
ageing; ceramics; electric breakdown; insulated gate bipolar transistors; partial discharges; power electronics; space charge; substrates; Al2O3; AlN; IGBT power module; aging; ceramic material; electric breakdown; electrical characteristics; electrofracture; inverter; lifetime; partial discharge; power electronic substrate; reliability; space charge; thermal characteristics; Aging; Ceramics; Electronics cooling; Insulated gate bipolar transistors; Inverters; Materials reliability; Multichip modules; Performance evaluation; Power electronics; Switches;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2000 Annual Report Conference on
Conference_Location :
Victoria, BC
Print_ISBN :
0-7803-6413-9
DOI :
10.1109/CEIDP.2000.884032
