Title :
On-chip tetrode JFET for RT X-ray spectroscopy: New results
Author :
Fazzi, Alberto ; Boggini, Rocco ; Corli, Luca ; Dalla Stella, Simone ; Silocchi, Paolo ; Varoli, Vincenzo ; Dalla Betta, Gian-Franco ; Pignatel, Giorgio U.
Author_Institution :
Department of Energy - CeSNEF of the Politecnico di Milano, via Ponzio 34/3, Italy, I-20233
Abstract :
A spectroscopy system, that consists of a 0.8 mm 2 PiN diode coupled to a 100/6 circular N-channel JFET, has been fully tested at room temperature. The energy resolution on the 26.34 keV line is 430 eV FWHM at 3 us shaping time and, at - 5°C, 330 keV at 10 us. The system is ready for the specific applications for which an integrated front-end transistor is needed, but a complete front-end integrated circuit is not viable.
Keywords :
Application specific integrated circuits; Diodes; Energy resolution; Integrated circuit technology; Nuclear and plasma sciences; Silicon; Spectroscopy; System testing; System-on-a-chip; Temperature;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location :
Dresden, Germany
Print_ISBN :
978-1-4244-2714-7
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2008.4775167
