• DocumentCode
    2629505
  • Title

    Resolution degradation of multiple-pixel event in pixellated CZT detectors

  • Author

    Kim, Jae Cheon ; Kaye, Willy ; Zhang, Feng ; He, Zhong

  • Author_Institution
    Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, 48109 USA
  • fYear
    2008
  • fDate
    19-25 Oct. 2008
  • Firstpage
    276
  • Lastpage
    280
  • Abstract
    The signals from 3-D position-sensitive pixellated CdZnTe (CZT) detectors have been modeled for the VAS_UM/TAT4 ASIC readout electronics. Each detector has dimensions of 20 mm × 20 mm × 15 mm, with an 11 × 11 square pixel anodes fabricated on the anode surface having a pixel pitch of 1.72 mm. Gamma-ray interactions with detector material, charge drift, charge trapping and diffusion, signal induction, system noise, pulse shaping, as well as ASIC triggering processes have all been simulated. This model is used to study energy resolution degradation of multiple-pixel events in pixellated CZT detectors. While full charge collection is achieved when interactions occur directly under the pixel, the decreased weighting potential under the gap reduces the total pulse amplitude of events that occur between pixels. Furthermore, weighting potential cross-talk induced by charge sharing between neighboring pixels will alter the total induced charge on each pixel. Through signal modeling, these specific effects on multiple-pixel-event energy resolution can be quantified and compared to the overall measured degradation.
  • Keywords
    Anodes; Application specific integrated circuits; Degradation; Energy resolution; Event detection; Gamma ray detection; Position sensitive particle detectors; Readout electronics; Signal detection; Signal resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
  • Conference_Location
    Dresden, Germany
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-2714-7
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2008.4775168
  • Filename
    4775168