DocumentCode
2629639
Title
Optimization of Medipix-2 threshold masks for spectroscopic X-ray imaging
Author
Procz, S. ; Lubke, J. ; Mix, M. ; Fiederle, M.
Author_Institution
Freiburger Materialforschungszentrum (FMF), Stefan-Meier-Str. 21, 79104 Freiburg, Germany
fYear
2008
fDate
19-25 Oct. 2008
Firstpage
315
Lastpage
318
Abstract
Spectroscopic X-ray imaging enhances image contrast and provides advanced object information due to energy resolution. The Medipix-2 is a photon counting semiconductor detector and features two energy thresholds for spectroscopic imaging. The aim of this study is to present the development of optimized threshold adjustment masks with small energy windows of about 3 keV and to demonstrate spectroscopic X-ray imaging using the example of an integrated circuit.
Keywords
Biomedical imaging; Computed tomography; Integrated circuit measurements; Optical imaging; Photonic integrated circuits; Radiation detectors; Spectroscopy; X-ray detection; X-ray detectors; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location
Dresden, Germany
ISSN
1095-7863
Print_ISBN
978-1-4244-2714-7
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2008.4775176
Filename
4775176
Link To Document