DocumentCode :
2629639
Title :
Optimization of Medipix-2 threshold masks for spectroscopic X-ray imaging
Author :
Procz, S. ; Lubke, J. ; Mix, M. ; Fiederle, M.
Author_Institution :
Freiburger Materialforschungszentrum (FMF), Stefan-Meier-Str. 21, 79104 Freiburg, Germany
fYear :
2008
fDate :
19-25 Oct. 2008
Firstpage :
315
Lastpage :
318
Abstract :
Spectroscopic X-ray imaging enhances image contrast and provides advanced object information due to energy resolution. The Medipix-2 is a photon counting semiconductor detector and features two energy thresholds for spectroscopic imaging. The aim of this study is to present the development of optimized threshold adjustment masks with small energy windows of about 3 keV and to demonstrate spectroscopic X-ray imaging using the example of an integrated circuit.
Keywords :
Biomedical imaging; Computed tomography; Integrated circuit measurements; Optical imaging; Photonic integrated circuits; Radiation detectors; Spectroscopy; X-ray detection; X-ray detectors; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location :
Dresden, Germany
ISSN :
1095-7863
Print_ISBN :
978-1-4244-2714-7
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2008.4775176
Filename :
4775176
Link To Document :
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