Title :
Western Australian Centre for Semiconductor Optoelectronics and Microsystems
Author_Institution :
Western Australian Centre for Semicond. Optoelectron. & Microsyst., Western Australia Univ., Crawley, WA, Australia
Abstract :
This article presents the background, vision-mission, and research programmes of the Western Australian Centre for Semiconductor Optoelectronics and Microsystems (WASCOM). The WASCOM facility aims to be a world leading research and development centre delivering solutions, new knowledge and education in advanced optoelectronics and microsystems technology. The research programmes currently under way include design, modeling, fabrication and characterization of infrared detectors based on mercury cadmium telluride semiconductor, GaN-based device fabrication, MEMS device fabrication, micromachining, and development of various dry etching and thin film deposition techniques. These WASCOM research programmes are provided with funding from various sources.
Keywords :
II-VI semiconductors; III-V semiconductors; cadmium compounds; chemical vapour deposition; etching; gallium compounds; infrared detectors; integrated optics; integrated optoelectronics; mercury compounds; micromachining; micromechanical devices; photodetectors; research and development; semiconductor device models; thin films; GaN; GaN-based device fabrication; HgCdTe; MEMS device fabrication; WASCOM; advanced optoelectronics; chemical vapour deposition systems; dry etching; film deposition; infrared detectors; mercury cadmium telluride semiconductor; micromachining; microsystems technology; photodetector characterization; photodetector design; photodetector fabrication; photodetector modeling; research and development centre; research funding; research programmes; vision-mission; Australia; Cadmium compounds; Dry etching; Educational programs; Educational technology; Infrared detectors; Microelectromechanical devices; Micromachining; Optical device fabrication; Research and development;
Conference_Titel :
Lasers and Electro-Optics Society, 2005. LEOS 2005. The 18th Annual Meeting of the IEEE
Print_ISBN :
0-7803-9217-5
DOI :
10.1109/LEOS.2005.1547848
