Title :
Recognition of planar object classes
Author :
Burl, M.C. ; Perona, P.
Author_Institution :
California Inst. of Technol., Pasadena, CA, USA
Abstract :
We present a new framework for recognizing planar object classes, which is based on local feature detectors and a probabilistic model of the spatial arrangement of the features. The allowed object deformations are represented through shape statistics, which are learned from examples. Instances of an object in an image are detected by finding the appropriate features in the correct spatial configuration. The algorithm is robust with respect to partial occlusion, detector false alarms, and missed features. A 94% success rate was achieved for the problem of locating quasi-frontal views of faces in cluttered scenes
Keywords :
face recognition; object recognition; pattern recognition; cluttered scenes; local feature detectors; object deformations; planar object classes; probabilistic model; quasi-frontal views; shape statistics; spatial arrangement; Computer vision; Detectors; Face detection; Humans; Layout; Object detection; Pattern recognition; Robustness; Shape; Statistics;
Conference_Titel :
Computer Vision and Pattern Recognition, 1996. Proceedings CVPR '96, 1996 IEEE Computer Society Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-7259-5
DOI :
10.1109/CVPR.1996.517078