DocumentCode :
2630067
Title :
Redundancy identification and removal based on implicit state enumeration
Author :
Cho, Hyunwoo ; Hachtel, Gary D. ; Somenzi, Fabio
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
fYear :
1991
fDate :
14-16 Oct 1991
Firstpage :
77
Lastpage :
80
Abstract :
The knowledge of the state transition graph (STG) of a sequential circuit helps in generating test sequences and identifying redundancies. The application of algorithms to the identification and removal of redundancies is reported. This strategy is based on traversing the STG of the given circuit and then performing redundancy identification using the reachability information calculated by the traversal. This method considers one candidate redundancy at a time, in an order that tries to minimize the total processing time. Substantial area and delay reductions are achieved. Experiments show that for many circuits 100% of the sequentially redundant faults can be eliminated in very reasonable amounts of time
Keywords :
circuit analysis computing; delays; graph theory; logic testing; redundancy; sequential circuits; VERITAS; delay reductions; reachability information; redundancy identification; redundancy removal; sequential circuit; sequentially nonexcitable fault; sequentially redundant faults; state enumeration; state transition graph; Boolean functions; Circuit faults; Circuit testing; Clocks; Data structures; Fault diagnosis; Flip-flops; Redundancy; Sequential analysis; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1991. ICCD '91. Proceedings, 1991 IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-2270-9
Type :
conf
DOI :
10.1109/ICCD.1991.139849
Filename :
139849
Link To Document :
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