DocumentCode :
2630139
Title :
The characterization of CdTe TimePix device and the study of its capabilities for the double beta decay measurements
Author :
Cermak, P. ; Stekl, I. ; Bocarov, V. ; Jakubek, J. ; Pospisil, S. ; Fiederle, M. ; Zuber, K.
Author_Institution :
Institute of Experimental and Applied Physics, Czech Technical University in Prague, Horska 3a/22, 12800, Czech Republic
fYear :
2008
fDate :
19-25 Oct. 2008
Firstpage :
444
Lastpage :
445
Abstract :
This work aims at the characterization of cadmium-telluride detector bump-bonded on the TimePix readout chip and the evaluation of its potential as a tool to study the double beta decay (ββ) processes (such as ββ or EC/EC), typically performed in ultra low background conditions. First tests with the CdTe pixelated sensor (256x256 pixel matrix, 55μ, m pitch, 1mm sensor thickness) have been performed. The results of the device calibration and testing of the spectroscopic properties as well as the estimation of intrinsic background of the device are presented.
Keywords :
Calibration; Counting circuits; Current measurement; Detectors; Isotopes; Performance evaluation; Physics; Radioactive decay; Spectroscopy; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location :
Dresden, Germany
ISSN :
1095-7863
Print_ISBN :
978-1-4244-2714-7
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2008.4775203
Filename :
4775203
Link To Document :
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