DocumentCode
2630139
Title
The characterization of CdTe TimePix device and the study of its capabilities for the double beta decay measurements
Author
Cermak, P. ; Stekl, I. ; Bocarov, V. ; Jakubek, J. ; Pospisil, S. ; Fiederle, M. ; Zuber, K.
Author_Institution
Institute of Experimental and Applied Physics, Czech Technical University in Prague, Horska 3a/22, 12800, Czech Republic
fYear
2008
fDate
19-25 Oct. 2008
Firstpage
444
Lastpage
445
Abstract
This work aims at the characterization of cadmium-telluride detector bump-bonded on the TimePix readout chip and the evaluation of its potential as a tool to study the double beta decay (ββ) processes (such as β−β− or EC/EC), typically performed in ultra low background conditions. First tests with the CdTe pixelated sensor (256x256 pixel matrix, 55μ, m pitch, 1mm sensor thickness) have been performed. The results of the device calibration and testing of the spectroscopic properties as well as the estimation of intrinsic background of the device are presented.
Keywords
Calibration; Counting circuits; Current measurement; Detectors; Isotopes; Performance evaluation; Physics; Radioactive decay; Spectroscopy; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location
Dresden, Germany
ISSN
1095-7863
Print_ISBN
978-1-4244-2714-7
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2008.4775203
Filename
4775203
Link To Document